Comparison
Scanning Electron Microscope
A scanning electron microscope can provide a considerable amount of depth of field (greater than that of the Ergonom system) and very high quality black and white images.
The resolution capabilities of the Ergonom microscopes reach into the realms of mid-range SEM while offering a number of advantages:
Scanning Electron Microscope
SEM image of computer chip as photographed at 45° angle in B&W
Ergonom Microscope
Ergonom as photographed at 90° angle with DOF in color
SEM Image corrected (stretched) to simulate 90° angle
Ergonom images precisely in both X and Y axis at 90°