Phase Contrast without Over-Exposure! - Grayfield Optical Inc - High Resolution Optical Microscopes

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Phase Contrast without Over-Exposure!

Comparison

The phase contrast method is used for all thin-layered structures including fibres and textiles. With conventional methods, focussing is limited by overlapping layers and the structures also have the same fractal index causing the structures to become blurred. The Grayfield technology removes these limitations and provides clear and sharp contours.

Phase Contrast
Conventional Phase Contrast
SeeNano Microscope
Ergonom Microscope
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© Copyright 1976-2017: Grayfield Optical, Inc.
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© 1976-2017: Grayfield Optical, Inc.
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